• DocumentCode
    908078
  • Title

    Radiation Damage in Microcircuits Session Summary

  • Author

    Hartill, D. L.

  • Author_Institution
    Cornell University
  • Volume
    33
  • Issue
    1
  • fYear
    1986
  • Firstpage
    35
  • Lastpage
    38
  • Keywords
    CMOS technology; Circuits; Event detection; Ionizing radiation; Neutrons; Particle tracking; Physics; Radiation detectors; Space technology; Very large scale integration;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1986.4337043
  • Filename
    4337043
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=908078