• DocumentCode
    908548
  • Title

    Monte carlo particle simulation of a GaAs MESFET with a gate trench sloping towards the source

  • Author

    Moglestue, C.

  • Author_Institution
    GEC Research Ltd., Hirst Research Centre, Wembley, UK
  • Volume
    132
  • Issue
    5
  • fYear
    1985
  • fDate
    10/1/1985 12:00:00 AM
  • Firstpage
    217
  • Lastpage
    223
  • Abstract
    A MESFET design with a shallow gate trench that slopes towards the source is proposed. Its characteristics have been simulated by means of the Monte Carlo particle model and compared to those of a planar and uniformly recessed gate structure of similar geometry. The sloped gate should reduce the resistance in the conduction channel and improve the noise figure. It is found that this device combines the good unilateral gain of the planar device and the low intrinsic minimum noise figure of the best uniformly recessed gate transistor. In uniformly recessed gate structures it was found that the length of the gate is important in reducing the noise: by shielding the source field fluctuations from the drain field ones it is possible to reduce the minimum noise figure. The simulation comprises both the DC and the AC characteristics. The latter is obtained around an operating point chosen with the drain biased at saturation. The distributions of fields and carriers for the sloped gate device have been plotted at this point and the equivalent circuit elements extracted.
  • Keywords
    III-V semiconductors; Monte Carlo methods; Schottky gate field effect transistors; equivalent circuits; gallium arsenide; semiconductor device models; AC characteristics; DC characteristics; GaAs MESFET; Monte Carlo particle simulation; carrier distribution; conduction channel resistance; equivalent circuit elements; field distribution; gate trench; modelling; noise figure; sloped gate; source field fluctuations; unilateral gain;
  • fLanguage
    English
  • Journal_Title
    Solid-State and Electron Devices, IEE Proceedings I
  • Publisher
    iet
  • ISSN
    0143-7100
  • Type

    jour

  • DOI
    10.1049/ip-i-1.1985.0048
  • Filename
    4643971