• DocumentCode
    909139
  • Title

    Ridge-width dependence on high-temperature continuous-wave quantum-cascade laser operation

  • Author

    Slivken, S. ; Yu, J.S. ; Evans, A. ; David, J. ; Doris, L. ; Razeghi, M.

  • Author_Institution
    Electr. & Comput. Eng. Dept., Northwestern Univ., Evanston, IL, USA
  • Volume
    16
  • Issue
    3
  • fYear
    2004
  • fDate
    3/1/2004 12:00:00 AM
  • Firstpage
    744
  • Lastpage
    746
  • Abstract
    We report continuous-wave (CW) operation of quantum-cascade lasers (/spl lambda/=6 μm) up to a temperature of 313 K (40/spl deg/C). The maximum CW optical output powers range from 212 mW at 288 K to 22 mW at 313 K and are achieved with threshold current densities of 2.21 and 3.11 kA/cm2, respectively, for a high-reflectivity-coated 12-μm-wide and 2-mm-long laser. At room temperature (298 K), the power output is 145 mW at 0.87 A, corresponding to a power conversion efficiency of 1.68%. The maximum CW operating temperature of double-channel ridge waveguide lasers mounted epilayer-up on copper heatsinks is analyzed in terms of the ridge width, which is varied between 12 and 40 μm. A clear trend of improved performance is observed as the ridge narrows.
  • Keywords
    current density; heat sinks; high-temperature effects; optical testing; quantum cascade lasers; ridge waveguides; waveguide lasers; 0.87 A; 1.68 percent; 12 to 40 mum; 145 mW; 2 mm; 212 mW; 22 mW; 288 K; 298 K; 313 K; 40 degC; 6 mum; continuous-wave operation; copper heatsinks; double-channel ridge waveguide lasers; high-reflectivity-coated laser; high-temperature operation; infrared measurements; power conversion efficiency; quantum-cascade lasers; quantum-well lasers; ridge width; ridge-width dependence; room temperature; threshold current densities; Etching; Gas lasers; Optical device fabrication; Power generation; Power lasers; Quantum cascade lasers; Quantum computing; Semiconductor lasers; Temperature distribution; Waveguide lasers;
  • fLanguage
    English
  • Journal_Title
    Photonics Technology Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1041-1135
  • Type

    jour

  • DOI
    10.1109/LPT.2004.823746
  • Filename
    1269781