• DocumentCode
    910608
  • Title

    A flexible 128 channel silicon strip detector instrumentation integrated circuit with sparse data readout

  • Author

    Kleinfelder, Stuart A. ; Carithers, William C., Jr. ; Ely, Robert P., Jr. ; Haber, Carl ; Kirsten, Frederick ; Spieler, Helmuth G.

  • Author_Institution
    Lawrence Berkeley Lab., Berkeley, CA, USA
  • Volume
    35
  • Issue
    1
  • fYear
    1988
  • Firstpage
    171
  • Lastpage
    175
  • Abstract
    A full-custom CMOS integrated circuit for silicon strip detector systems has been designed, fabricated, and tested. The circuit contains 128 parallel data-acquisition channels and considerable peripheral circuitry. Each channel consists of a low-noise, low-power, charge-sensitive amplifier, a multistage autobalanced comparator, an analog multiplexer, nearest-neighbor logic, priority-search logic, and a share of a position-encoding read-only memory. The analog system can substract both detector pedestal and leakage current on a channel-by-channel basis. A key feature of this design is the inclusion of on-chip sparse read-out circuitry, which allows efficient management of low-occupancy events. Designed for use at the Collider Detector Facility (CDF) at Fermilab, the circuit is suitable for large-scale silicon detector systems requiring a large, dense array of fast, low-power electronics.<>
  • Keywords
    CMOS integrated circuits; semiconductor counters; 128 parallel data-acquisition channels; Collider Detector Facility; Fermilab; Si strip detector; analog multiplexer; channel-by-channel basis; charge-sensitive amplifier; detector pedestal; full-custom CMOS integrated circuit; leakage current; low-noise; low-occupancy events; low-power; multistage autobalanced comparator; nearest-neighbor logic; on-chip sparse read-out circuitry; peripheral circuitry; position-encoding read-only memory; priority-search logic; sparse data readout; CMOS integrated circuits; CMOS logic circuits; Circuit testing; Detectors; Instruments; Integrated circuit testing; Low-noise amplifiers; Silicon; Strips; System testing;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/23.12699
  • Filename
    12699