• DocumentCode
    911747
  • Title

    Increase in sustaining voltage of gate-turnoff thyristors by an innovative floating gate structure

  • Author

    Nagano, T. ; Kimura, S. ; Yatsuo, T. ; Fukui, H.

  • Author_Institution
    Hitachi Ltd., Hitachi Research Laboratory, Hitachi, Japan
  • Volume
    134
  • Issue
    3
  • fYear
    1987
  • fDate
    6/1/1987 12:00:00 AM
  • Firstpage
    77
  • Lastpage
    80
  • Abstract
    The turnoff capability of a gate-turnoff thyristor is described by a sustaining voltage Vs which is the maximum reapplied voltage during current interruption. An innovative floating gate structure in which one of the two gate electrodes formed on both sides of the cathode emitter is connected to the external gate terminal provides a significant increase in Vs of more than 800 V from the 600 V of a conventional gate structure. This is attributed to the series gate conductance which is more than three times larger than that of the conventional gate structure during the tail period.
  • Keywords
    thyristors; 800 V; cathode emitter; current interruption; external gate terminal; floating gate structure; gate-turnoff thyristors; maximum reapplied voltage; series gate conductance; sustaining voltage; tail period;
  • fLanguage
    English
  • Journal_Title
    Solid-State and Electron Devices, IEE Proceedings I
  • Publisher
    iet
  • ISSN
    0143-7100
  • Type

    jour

  • DOI
    10.1049/ip-i-1.1987.0012
  • Filename
    4644310