DocumentCode
915994
Title
Recent developments in the pressure wave propagation method
Author
HoIe, S.
Author_Institution
LPEM/LEG, UPMC-Paris 6, Paris
Volume
25
Issue
3
fYear
2009
Firstpage
7
Lastpage
20
Abstract
Performing measurements is an essential part of understanding physical phenomena. Hence, numerous measuring techniques have been developed to study space charge build-up in dielectrics. This macroscopic accumulation of charge modifies the electric field and can lead to aging and premature failure of electrical insulation. On the other hand, charge accumulation is essential to the operation of devices such as electret- or piezoelectric-based sensors. It is therefore essential to study charge build-up in order to design insulating materials in which excessive charge does not accumulate, or electrets in which a sufficiently large amount of charge accumulates to ensure adequate device operation, and the stability of that charge in time is sufficient to ensure an acceptable device life-time. This paper focuses on the measurement method using a pressure wave to perturb the charges. That method is commonly called the pressure-wave-propagation (PWP) method. A pressure wave enters the sample through one of its interfaces. As it travels through the material at the velocity of sound, the charges encountered are mechanically displaced.
Keywords
insulating materials; pressure measurement; space charge; wave propagation; charge accumulation; electret; electric field; electrical insulation; insulating materials; macroscopic accumulation; piezoelectric-based sensors; pressure wave propagation method; Aging; Charge measurement; Current measurement; Dielectric measurements; Dielectrics and electrical insulation; Electrets; Performance evaluation; Piezoelectric devices; Space charge; Stability; Pressure-wave-propagation method, PWP method, LIPP method, space charge distribution, divergent field, fillers, laminates, high spatial resolution;
fLanguage
English
Journal_Title
Electrical Insulation Magazine, IEEE
Publisher
ieee
ISSN
0883-7554
Type
jour
DOI
10.1109/MEI.2009.4976898
Filename
4976898
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