• DocumentCode
    917056
  • Title

    A 0.1–5 GHz Cryogenic SiGe MMIC LNA

  • Author

    Bardin, Joseph C. ; Weinreb, Sander

  • Author_Institution
    California Inst. of Technol., Pasadena, CA
  • Volume
    19
  • Issue
    6
  • fYear
    2009
  • fDate
    6/1/2009 12:00:00 AM
  • Firstpage
    407
  • Lastpage
    409
  • Abstract
    In this letter, the design and measurement of the first SiGe integrated-circuit LNA specifically designed for operation at cryogenic temperatures is presented. At room temperature, the circuit provides greater than 25.8 dB of gain with an average noise temperature (Te) of 76 K (NF = 1 dB) and S11 of -9 dB for frequencies in the 0.1-5 GHz band. At 15 K, the amplifier has greater than 29.6 dB of gain with an average Te of 4.3 K and S11 of -14.6 dB for frequencies in the 0.1-5 GHz range. To the authors´ knowledge, this is the lowest noise ever reported for a silicon integrated circuit operating in the low microwave range and the first matched wideband cryogenic integrated circuit LNA that covers frequencies as low as 0.1 GHz.
  • Keywords
    BiCMOS integrated circuits; Ge-Si alloys; MMIC amplifiers; bipolar MMIC; cryogenic electronics; low noise amplifiers; BiCMOS8HP process; HBT; SiGe; cryogenic MMIC LNA; frequency 0.1 GHz to 5 GHz; heterojunction bipolar transistor; integrated-circuit LNA; low-noise amplifier; silicon integrated circuit; temperature 15 K; temperature 293 K to 298 K; temperature 76 K; wideband LNA; BiCMOS; SiGe; cryogenic; heterojunction bipolar transistors (HBT); integrated circuit (IC); low temperature; low-noise amplifier (LNA); noise;
  • fLanguage
    English
  • Journal_Title
    Microwave and Wireless Components Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1531-1309
  • Type

    jour

  • DOI
    10.1109/LMWC.2009.2020041
  • Filename
    4982544