DocumentCode
917513
Title
A Wave Approach to the Noise Properties of Linear Microwave Devices
Author
Meys, R.P.
Volume
26
Issue
1
fYear
1978
fDate
1/1/1978 12:00:00 AM
Firstpage
34
Lastpage
37
Abstract
Noise temperature or noise factor are important parameters for many microwave devices. Their dependence on source characteristics is classically established using low-frequency concepts such as impedance, admittance, voltage, and current sources. This paper presents a derivation of the noise properties of linear two-ports in terms of noise waves, which leads to a convenient measurement method in distributed systems.
Keywords
Circuit noise; Fabrication; Impedance; Laboratories; Low-frequency noise; Microwave devices; Schottky diodes; Semiconductor device noise; Semiconductor diodes; Temperature;
fLanguage
English
Journal_Title
Microwave Theory and Techniques, IEEE Transactions on
Publisher
ieee
ISSN
0018-9480
Type
jour
DOI
10.1109/TMTT.1978.1129303
Filename
1129303
Link To Document