• DocumentCode
    919139
  • Title

    Thermal analysis of preswitching characteristics of a thin-film amorphous-chalcogenide switch

  • Author

    Thomas, C.B. ; Carew-Jones, R. ; Bosnell, J.

  • Author_Institution
    Royal Radar Establishment, Great Malvern, UK
  • Volume
    8
  • Issue
    17
  • fYear
    1972
  • Firstpage
    447
  • Lastpage
    449
  • Abstract
    The preswitching nonohmic behaviour of amorphous-semiconductor switches could result from either Joule heating or space-charge-limited currents. After the `forming¿ of a virgin device, electron-microscope examinations have revealed a channel whose composition differs significantly from the matrix. Also, the I/V characteristics of the blocking states of virgin and formed devices are significantly different. The preswitching I/V characteristics of a Ge15Te81S4 chalcogenide-glass switch at 300 K have been explained by Joule heating in the formed channel, with an estimated temperature rise of 25 degC above ambient at the centre of a monostable switch.
  • Keywords
    heating; semiconductor switches; thin film devices; Ge; I/V characteristics; Joule heating; S; Te; electron microscope examination; glass; preswitching characteristics; semiconductor switches; thermal analysis; thin film amorphous chalcogenide switch;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19720324
  • Filename
    4235783