DocumentCode
919152
Title
Decay Mechanisms of Radiation Pattern and Optical Spectrum of High-Power LED Modules in Aging Test
Author
Tsai, Chun-Chin ; Chen, Ming-Hung ; Huang, Yi-Chung ; Hsu, Yi-Cheng ; Lo, Yuan-Tsun ; Lin, Ying-Jyun ; Kuang, Jao-Hwa ; Huang, Sheng-Bang ; Hu, Hung-Lieh ; Su, Yeh-I ; Cheng, Wood-Hi
Author_Institution
Dept. of Photonics, Nat. Sun Yat-sen Univ., Kaohsiung, Taiwan
Volume
15
Issue
4
fYear
2009
Firstpage
1156
Lastpage
1162
Abstract
Decay of radiation pattern and optical spectrum of high-power LED modules fabricated by different manufacturers after a thermal-aging test were investigated experimentally and numerically. Samples were aged at 65degC, 85degC, and 95degC under a constant current of 350 mA. The results showed that the radiation pattern of the LED modules at the two view angles of plusmn(45deg ~ 75deg) decreased more than the other angles as aging time increased. This was due to the reduction of optical power from corner shape of lens. Due to the degradation of lens material after thermal aging, the center wavelength of the LED spectrum shifted 5 nm. Furthermore, the radius curvature of plastic lens was observed to have 6-70 mum contraction as aging times increased. The key module package related to the decrease of power density, the change of radiation pattern, and the shift of optical spectrum in high-power LED modules under thermal aging were due to the degradation of lens material and lens structure. Both experimental and simulated results clearly indicated that improving the lens structure and lens material is essential to extend the operating life of the high-power LED modules. This study may provide practical LED package guidelines in low-cost consumer applications.
Keywords
ageing; lenses; light emitting diodes; modules; high-power LED modules; lens material degradation; optical spectrum; plastic lens; radiation pattern decay; radius curvature; temperature 65 degC; temperature 85 degC; temperature 95 degC; thermal-aging test; Aging test; high-power LED modules; plastic lens design;
fLanguage
English
Journal_Title
Selected Topics in Quantum Electronics, IEEE Journal of
Publisher
ieee
ISSN
1077-260X
Type
jour
DOI
10.1109/JSTQE.2009.2015332
Filename
4982739
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