DocumentCode
920033
Title
MTBF of a complex binary coherent system
Author
Kim, Chul
Author_Institution
Agency for Defense Dev., Daejeon, South Korea
Volume
38
Issue
4
fYear
1989
fDate
10/1/1989 12:00:00 AM
Firstpage
411
Lastpage
415
Abstract
It is noted that there has yet been no detailed study of the relationships between the MTBF (mean time between failures) of a system and the sequences of component failures, except for the case of a series system where every component failure causes a system failure. The author defines MTBF anew and derives relationships between the properties of the MTBF of a binary coherent system and the properties of the sequences of component failures, assuming that the lifetime distributions of the components are either new-better-than-used (NBU) exponential or increasing failure rate (IFR). Lower bounds of MTBF that can be used to predict the MTBF and to decide whether the system would satisfy the MTBF requirement are derived
Keywords
failure analysis; reliability theory; MTBF; complex binary coherent system; component failure sequences; increasing failure rate; lifetime distributions; mean time between failures; new-better-than-used exponential distribution; reliability; Failure analysis; Random variables; Reliability theory; Stochastic processes; Weapons;
fLanguage
English
Journal_Title
Reliability, IEEE Transactions on
Publisher
ieee
ISSN
0018-9529
Type
jour
DOI
10.1109/24.46452
Filename
46452
Link To Document