• DocumentCode
    920591
  • Title

    Memory characteristics of p type-germanium/n type-cadmium-sulphide heterojunctions

  • Author

    Duncan, W.

  • Author_Institution
    University of Glasgow, Department of Electronics & Electrical Engineering, Glasgow, UK
  • Volume
    8
  • Issue
    26
  • fYear
    1972
  • Firstpage
    636
  • Lastpage
    637
  • Abstract
    The V/I characteristics of p Ge-n CdS heterojunctions exhibit a hysteresis or memory characteristic which is the result of two diode conduction states of resistances 106 and 10¿. The device switches from the high to the low state in less than 30 ns under reverse bias, and resetting to the high-resistance state occurs in less than 100 ns when a threshold forward bias current is exceeded. In either state, the device retains its state for periods greater than two weeks and appears to have potential application as a fast, nonvolatile memory element.
  • Keywords
    germanium; hysteresis; p-n heterojunctions; semiconductor storage devices; sodium compounds; Hysteresis; V/I characteristics; memory characteristics; n-CdS; p-Ge; p-n heterojunctions; semiconductor storage devices;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19720460
  • Filename
    4235928