DocumentCode
920591
Title
Memory characteristics of p type-germanium/n type-cadmium-sulphide heterojunctions
Author
Duncan, W.
Author_Institution
University of Glasgow, Department of Electronics & Electrical Engineering, Glasgow, UK
Volume
8
Issue
26
fYear
1972
Firstpage
636
Lastpage
637
Abstract
The V/I characteristics of p Ge-n CdS heterojunctions exhibit a hysteresis or memory characteristic which is the result of two diode conduction states of resistances 106 and 10¿. The device switches from the high to the low state in less than 30 ns under reverse bias, and resetting to the high-resistance state occurs in less than 100 ns when a threshold forward bias current is exceeded. In either state, the device retains its state for periods greater than two weeks and appears to have potential application as a fast, nonvolatile memory element.
Keywords
germanium; hysteresis; p-n heterojunctions; semiconductor storage devices; sodium compounds; Hysteresis; V/I characteristics; memory characteristics; n-CdS; p-Ge; p-n heterojunctions; semiconductor storage devices;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19720460
Filename
4235928
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