• DocumentCode
    922908
  • Title

    The influence of finite conductor thickness and conductivity on fundamental and higher-order modes in miniature hybrid MIC´s (MHMIC´s) and MMIC´s

  • Author

    Wu, Ke ; Vahldieck, Rudiger ; Fikart, Josef L. ; Minkus, H.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Ecole Polytech. de Montreal, Que., Canada
  • Volume
    41
  • Issue
    3
  • fYear
    1993
  • fDate
    3/1/1993 12:00:00 AM
  • Firstpage
    421
  • Lastpage
    430
  • Abstract
    The effect of finite metallization thickness and finite conductivity on the propagation characteristics of conductor-backed CPW on thin substrate is rigorously analyzed. A self-consistent approach is used together with the method of lines (MoL) to determine the propagation constant, losses and field distribution of the fundamental and first two higher-order modes in coplanar waveguides (CPWs) with finite metallization thickness and lossy backmetallization. The method used is general and can be applied to miniature MHMICs and MMICs including lossy semiconductor substrate. It is shown that the onset of higher-order modes limits the usable frequency range of conductor-backed CPWs. The analysis also includes microstrip transmission lines on thin substrate material. It is demonstrated that a resistive strip embedded into the microstrip ground plane may potentially be useful in the design of integrated planar attenuators
  • Keywords
    MMIC; electrical conductivity of solids; hybrid integrated circuits; losses; metallisation; microstrip components; microwave integrated circuits; strip line components; MMICs; conductor-backed CPW; coplanar waveguides; embedded resistive strip; field distribution; finite conductivity; finite conductor thickness; finite metallization thickness; fundamental mode; higher-order modes; hybrid MIC; integrated planar attenuators; losses; lossy backmetallization; lossy semiconductor substrate; method of lines; microstrip ground plane; microstrip transmission lines; miniature MHMICs; propagation characteristics; propagation constant; thin substrate material; Conductivity; Conductors; Coplanar waveguides; MMICs; Metallization; Microstrip; Propagation constant; Propagation losses; Semiconductor waveguides; Substrates;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/22.223740
  • Filename
    223740