DocumentCode
922908
Title
The influence of finite conductor thickness and conductivity on fundamental and higher-order modes in miniature hybrid MIC´s (MHMIC´s) and MMIC´s
Author
Wu, Ke ; Vahldieck, Rudiger ; Fikart, Josef L. ; Minkus, H.
Author_Institution
Dept. of Electr. & Comput. Eng., Ecole Polytech. de Montreal, Que., Canada
Volume
41
Issue
3
fYear
1993
fDate
3/1/1993 12:00:00 AM
Firstpage
421
Lastpage
430
Abstract
The effect of finite metallization thickness and finite conductivity on the propagation characteristics of conductor-backed CPW on thin substrate is rigorously analyzed. A self-consistent approach is used together with the method of lines (MoL) to determine the propagation constant, losses and field distribution of the fundamental and first two higher-order modes in coplanar waveguides (CPWs) with finite metallization thickness and lossy backmetallization. The method used is general and can be applied to miniature MHMICs and MMICs including lossy semiconductor substrate. It is shown that the onset of higher-order modes limits the usable frequency range of conductor-backed CPWs. The analysis also includes microstrip transmission lines on thin substrate material. It is demonstrated that a resistive strip embedded into the microstrip ground plane may potentially be useful in the design of integrated planar attenuators
Keywords
MMIC; electrical conductivity of solids; hybrid integrated circuits; losses; metallisation; microstrip components; microwave integrated circuits; strip line components; MMICs; conductor-backed CPW; coplanar waveguides; embedded resistive strip; field distribution; finite conductivity; finite conductor thickness; finite metallization thickness; fundamental mode; higher-order modes; hybrid MIC; integrated planar attenuators; losses; lossy backmetallization; lossy semiconductor substrate; method of lines; microstrip ground plane; microstrip transmission lines; miniature MHMICs; propagation characteristics; propagation constant; thin substrate material; Conductivity; Conductors; Coplanar waveguides; MMICs; Metallization; Microstrip; Propagation constant; Propagation losses; Semiconductor waveguides; Substrates;
fLanguage
English
Journal_Title
Microwave Theory and Techniques, IEEE Transactions on
Publisher
ieee
ISSN
0018-9480
Type
jour
DOI
10.1109/22.223740
Filename
223740
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