• DocumentCode
    923529
  • Title

    Stability criterion for semiconductor plates with negative AC mobility

  • Author

    Heinle, W. ; Engelmann, R.W.H.

  • Volume
    60
  • Issue
    7
  • fYear
    1972
  • fDate
    7/1/1972 12:00:00 AM
  • Firstpage
    914
  • Lastpage
    915
  • Abstract
    The critical n0L product of semiconductor plates with negative longitudinal ac mobility and finite thickness is investigated theoretically as a function of the sample dimensions and the degree of dielectric loading. In case of a small sample thickness-to-length ratio the stability range is found to be strongly reduced due to higher order characteristic oscillations.
  • Keywords
    Boundary conditions; Cathodes; Dielectrics; Electric fields; Frequency; Impedance; Ohmic contacts; Space charge; Stability criteria; Voltage;
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IEEE
  • Publisher
    ieee
  • ISSN
    0018-9219
  • Type

    jour

  • DOI
    10.1109/PROC.1972.8806
  • Filename
    1450736
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=923529