• DocumentCode
    924102
  • Title

    Logical/linear operators for image curves

  • Author

    Iverson, Lee A. ; Zucker, Steven W.

  • Author_Institution
    Artificial Intelligence Center, SRI Int., Menlo Park, CA, USA
  • Volume
    17
  • Issue
    10
  • fYear
    1995
  • fDate
    10/1/1995 12:00:00 AM
  • Firstpage
    982
  • Lastpage
    996
  • Abstract
    We propose a language for designing image measurement operators suitable for early vision. We refer to them as logical/linear (L/L) operators, since they unify aspects of linear operator theory and Boolean logic. A family of these operators appropriate for measuring the low-order differential structure of image curves is developed. These L/L operators are derived by decomposing a linear model into logical components to ensure that certain structural preconditions for the existence of an image curve are upheld. Tangential conditions guarantee continuity, while normal conditions select and categorize contrast profiles. The resulting operators allow for coarse measurement of curvilinear differential structure (orientation and curvature) while successfully segregating edge-and line-like features. By thus reducing the incidence of false-positive responses, these operators are a substantial improvement over (thresholded) linear operators which attempt to resolve the same class of features
  • Keywords
    Boolean functions; computer vision; edge detection; feature extraction; image segmentation; Boolean logic; computer vision; curvilinear differential structure; early vision; edge detection; edge-like features; false-positive responses; feature extraction; image curves; image measurement operators; line-like features; linear model; linear operator theory; logical/linear operators; low-order differential structure; tangential conditions; Biological information theory; Boolean functions; Computer vision; Detectors; Ear; Feature extraction; Gaussian noise; Image edge detection; Integrated circuit noise; Machine vision;
  • fLanguage
    English
  • Journal_Title
    Pattern Analysis and Machine Intelligence, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0162-8828
  • Type

    jour

  • DOI
    10.1109/34.464562
  • Filename
    464562