DocumentCode
926059
Title
Recognition of shapes by editing their shock graphs
Author
Sebastian, Thomas B. ; Klein, Philip N. ; Kimia, Benjamin B.
Author_Institution
GE Global Res. Center, Schenectady, NY, USA
Volume
26
Issue
5
fYear
2004
fDate
5/1/2004 12:00:00 AM
Firstpage
550
Lastpage
571
Abstract
This paper presents a novel framework for the recognition of objects based on their silhouettes. The main idea is to measure the distance between two shapes as the minimum extent of deformation necessary for one shape to match the other. Since the space of deformations is very high-dimensional, three steps are taken to make the search practical: 1) define an equivalence class for shapes based on shock-graph topology, 2) define an equivalence class for deformation paths based on shock-graph transitions, and 3) avoid complexity-increasing deformation paths by moving toward shock-graph degeneracy. Despite these steps, which tremendously reduce the search requirement, there still remain numerous deformation paths to consider. To that end, we employ an edit-distance algorithm for shock graphs that finds the optimal deformation path in polynomial time. The proposed approach gives intuitive correspondences for a variety of shapes and is robust in the presence of a wide range of visual transformations. The recognition rates on two distinct databases of 99 and 216 shapes each indicate highly successful within category matches (100 percent in top three matches), which render the framework potentially usable in a range of shape-based recognition applications.
Keywords
equivalence classes; image recognition; object recognition; visual databases; databases; deformation paths; dynamic programming; edit-distance algorithm; equivalence class; object recognition; polynomial time; shape recognition; shock graphs; shock-graph topology; shock-graph transitions; silhouettes; visual transformations; Application software; Dynamic programming; Electric shock; Object recognition; Polynomials; Rendering (computer graphics); Robustness; Shape measurement; Topology; Visual databases; Algorithms; Artificial Intelligence; Computer Graphics; Computer Simulation; Image Enhancement; Image Interpretation, Computer-Assisted; Imaging, Three-Dimensional; Information Storage and Retrieval; Numerical Analysis, Computer-Assisted; Pattern Recognition, Automated; Reproducibility of Results; Sensitivity and Specificity; Signal Processing, Computer-Assisted;
fLanguage
English
Journal_Title
Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publisher
ieee
ISSN
0162-8828
Type
jour
DOI
10.1109/TPAMI.2004.1273924
Filename
1273924
Link To Document