• DocumentCode
    927232
  • Title

    Model requirements for simulation of low-voltage MOSFET in automotive applications

  • Author

    Buttay, Cyril ; Morel, Hervé ; Allard, Bruno ; Lefranc, Pierre ; Brevet, Olivier

  • Author_Institution
    Electr. Machines & Drives Res. Team, Univ. of Sheffield
  • Volume
    21
  • Issue
    3
  • fYear
    2006
  • fDate
    5/1/2006 12:00:00 AM
  • Firstpage
    613
  • Lastpage
    624
  • Abstract
    This paper focuses on the modeling of low-voltage automotive power electronic circuits to obtain accurate system simulation, including estimation of losses. The aim is to compare several metal-oxide semiconductor field-effect transistor (MOSFET) models to find out which can be used for low-voltage, high-current automotive converter simulations. As these models are intended for system simulation, only analytical models are addressed as they may be implemented into any circuit simulator. The different modes of operation of the switches are described (commutation, synchronous rectification, avalanche...), and several models of the power MOSFET transistor, allowing for simulation in these modes, are presented. Special care is given to the parameter extraction methods and to the interconnection model of the commutation cell. The four test circuits used to identify the low-voltage power MOSFET model parameters are presented. Comparison between simulations and measurements obtained with a calorimeter are then detailed. This measurement method is accurate and offers a simple way to prove the quality of simulation results. It is shown that the parameter identification is of major concern to achieve high accuracy, as classical Spice models can give good results, providing the model parameters are correctly set
  • Keywords
    automotive electronics; calorimeters; circuit testing; parameter estimation; power MOSFET; power convertors; automotive applications; commutation cell; low-voltage MOSFET; metal-oxide semiconductor field-effect transistor; parameter extraction method; parameter identification; power MOSFET; power electronic circuits; test circuits; Analytical models; Automotive applications; Automotive engineering; Circuit simulation; Circuit testing; MOS devices; MOSFET circuits; Power MOSFET; Power electronics; Power system modeling; Characterization; circuit parasitics; electrothermal; model; power metal-oxide semiconductor field-effect transistor (MOSFET); validation;
  • fLanguage
    English
  • Journal_Title
    Power Electronics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-8993
  • Type

    jour

  • DOI
    10.1109/TPEL.2006.872383
  • Filename
    1629001