• DocumentCode
    927328
  • Title

    Accuracy of Coupled-Mode Theory and Mode-Matching Method in the Analysis of Photonic Crystal Waveguide Perturbations

  • Author

    Theocharidis, Athanasios ; Kamalakis, Thomas ; Sphicopoulos, Thomas

  • Author_Institution
    Athens Univ., Athens
  • Volume
    25
  • Issue
    10
  • fYear
    2007
  • Firstpage
    3193
  • Lastpage
    3201
  • Abstract
    In this paper, the accuracy of coupled-mode theory (CMT) and mode-matching (MM) method in estimating the scattering due to geometric perturbations in photonic crystal waveguides (PCWs) is examined. Two CMT formulations are considered: the instantaneous virtual grating and the conventional CMT. The two CMT formulations and the MM method are compared against the finite-difference frequency-domain (FDFD) method combined with the adjoint variable (AV) method. The results obtained with the AV/FDFD and MM methods agree very well, proving the validity of the latter for the sensitivity analysis of PCW structures. It is also deduced that although both CMT formulations lead to almost identical results, they can provide only a first approximation to the perturbation-induced scattering.
  • Keywords
    coupled mode analysis; finite difference methods; integrated optics; micro-optics; nanotechnology; optical waveguide theory; perturbation theory; photonic crystals; adjoint variable method; coupled-mode theory; finite-difference frequency-domain analysis; geometric perturbations; mode-matching; nanophotonic integrated circuits; perturbation-induced scattering; photonic crystal waveguides; sensitivity analysis; virtual grating; Augmented virtuality; Electromagnetic scattering; Finite difference methods; Frequency domain analysis; Gratings; Mode matching methods; Particle scattering; Photonic crystals; Sensitivity analysis; Waveguide theory; Coupled-mode analysis; mode-matching (MM) methods; perturbation methods; photonic crystal (PC); tolerance analysis;
  • fLanguage
    English
  • Journal_Title
    Lightwave Technology, Journal of
  • Publisher
    ieee
  • ISSN
    0733-8724
  • Type

    jour

  • DOI
    10.1109/JLT.2007.905220
  • Filename
    4346638