• DocumentCode
    928176
  • Title

    Electro-optic thin films of zinc sulphide

  • Author

    Jones, Paul L. ; Al-Khateeb, K.A.H.

  • Author_Institution
    University of Manchester, Electrical Engineering Laboratories, Manchester, UK
  • Volume
    11
  • Issue
    12
  • fYear
    1975
  • Firstpage
    262
  • Lastpage
    263
  • Abstract
    Highly ordered single-crystal films of cubic zinc sulphide are grown epitaxially on silicon substrates by sublimation in u.h.v. The electro-optic coefficients are measured using a sensitive a.c. method and values of r41 up to 6.73×10¿13 mV¿1 are reported.
  • Keywords
    II-VI semiconductors; integrated optics; optical films; semiconductor thin films; zinc compounds; ZnS; electrooptic coefficients; electrooptic thin films; epitaxial growth; silicon substrates; single crystal films; sublimation; ultra high vacuum;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19750198
  • Filename
    4236715
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=928176