Effects of current and frequency on write, read, and erase widths for thin-film inductive and magnetoresistive heads

Author

Lin, Tsann ; Christner, Jodie A. ; Mitchell, Terry B. ; Gau, J.-S. ; George, Peter K.

Author_Institution

Imprimis Technol. Inc., Minneapolis, MN, USA

Volume

25

Issue

1

fYear

1989

fDate

1/1/1989 12:00:00 AM

Firstpage

710

Lastpage

715

Abstract

The dependence of write, read, and erase widths on current and frequency for thin-film inductive (TFI) and inductive-write/magnetoresistive-read (MR) heads was studied. Currents of up to 150 mA and frequencies of up to 40 kFCI were used to write tracks. The widths were measured from ferrofluid patterns and electrical track scans. For both heads, the write width decreases but the side-erase width increase with increasing frequency. The relationship of these results to head-field contours, established from scanning magnetooptic imaging measurements, is discussed

Keywords

magnetic heads; magnetic recording; magnetic thin film devices; magneto-optical effects; magnetoresistance; 150 mA; current; electrical track scans; erase widths; ferrofluid patterns; frequency; head-field contours; magnetoresistive heads; read; scanning magnetooptic imaging measurements; thin film inductive heads; write; Chromium; Electric variables measurement; Frequency; Helium; Magnetic field measurement; Magnetic heads; Magnetooptic effects; Magnetooptic recording; Magnetoresistance; Transistors;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.22627

Filename

22627