• DocumentCode
    931512
  • Title

    Simulation of high-power 4H-SiC MESFETs with 3D tri-gate structure

  • Author

    Zhang, J. ; Zhang, B. ; Li, Z.

  • Author_Institution
    Center of IC Design, Univ. of Electron. Sci. & Technol. of China, Chengdu Sichuan
  • Volume
    43
  • Issue
    12
  • fYear
    2007
  • Firstpage
    692
  • Lastpage
    694
  • Abstract
    A novel 3D tri-gate 4H-SiC MESFET structure is proposed for high-power RF applications. In comparison with the conventional structure, improved saturation drain current is obtained owing to the formation of a vertical channel, which induces device equivalent channel width increase. The output power density of the proposed structure with t=2 mum, a=0.4 mum and w=0.6 mum is 15.5 W/mm compared to 4.2 W/mm for the conventional one and yet it maintains almost the same cutoff frequency (fT) and maximum oscillation frequency (fmax )
  • Keywords
    power MESFET; silicon compounds; wide band gap semiconductors; 3D tri-gate structure; SiC; device equivalent channel; drain current; high-power MESFET; high-power RF applications;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:20070777
  • Filename
    4237065