• DocumentCode
    934423
  • Title

    On the Transient Analysis of Circuits Containing Multiple Diodes

  • Author

    Blakey, P.A. ; Froelich, R.K.

  • Volume
    31
  • Issue
    9
  • fYear
    1983
  • Firstpage
    781
  • Lastpage
    783
  • Abstract
    Multiple-diode circuits are increasingly being used for power combining at microwave frequencies. This paper presents a method for the transient analysis of such circuits. The method exploits the cold-capacitance-particle-current decomposition of semiconductor diodes and is simpler, more efficient, and more accurate than previously proposed approaches to the problem.
  • Keywords
    Computed tomography; Equations; Laboratories; Matrix decomposition; Microwave circuits; Microwave imaging; Notice of Violation; Remote sensing; Semiconductor diodes; Transient analysis;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/TMTT.1983.1131593
  • Filename
    1131593