DocumentCode
934423
Title
On the Transient Analysis of Circuits Containing Multiple Diodes
Author
Blakey, P.A. ; Froelich, R.K.
Volume
31
Issue
9
fYear
1983
Firstpage
781
Lastpage
783
Abstract
Multiple-diode circuits are increasingly being used for power combining at microwave frequencies. This paper presents a method for the transient analysis of such circuits. The method exploits the cold-capacitance-particle-current decomposition of semiconductor diodes and is simpler, more efficient, and more accurate than previously proposed approaches to the problem.
Keywords
Computed tomography; Equations; Laboratories; Matrix decomposition; Microwave circuits; Microwave imaging; Notice of Violation; Remote sensing; Semiconductor diodes; Transient analysis;
fLanguage
English
Journal_Title
Microwave Theory and Techniques, IEEE Transactions on
Publisher
ieee
ISSN
0018-9480
Type
jour
DOI
10.1109/TMTT.1983.1131593
Filename
1131593
Link To Document