DocumentCode
939176
Title
2006 Latin American Test Workshop
Author
Vargas, F.
Author_Institution
General Chair, LATW ´06
Volume
23
Issue
3
fYear
2006
Firstpage
185
Lastpage
185
Abstract
The author presents highlights from the 7th Annual IEEE Latin American Test Workshop (LATW ´06), held in the capital city of Buenos Aires, Argentina, 26-29 March.
Keywords
Latin American Test Workshop; Latin American Test Workshop;
fLanguage
English
Journal_Title
Design & Test of Computers, IEEE
Publisher
ieee
ISSN
0740-7475
Type
jour
DOI
10.1109/MDT.2006.58
Filename
1634285
Link To Document