• DocumentCode
    939176
  • Title

    2006 Latin American Test Workshop

  • Author

    Vargas, F.

  • Author_Institution
    General Chair, LATW ´06
  • Volume
    23
  • Issue
    3
  • fYear
    2006
  • Firstpage
    185
  • Lastpage
    185
  • Abstract
    The author presents highlights from the 7th Annual IEEE Latin American Test Workshop (LATW ´06), held in the capital city of Buenos Aires, Argentina, 26-29 March.
  • Keywords
    Latin American Test Workshop; Latin American Test Workshop;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/MDT.2006.58
  • Filename
    1634285