• DocumentCode
    939600
  • Title

    A new approach to making thin film head-slider devices

  • Author

    Chapman, Daniel W.

  • Author_Institution
    IBM Corp., San Jose, CA, USA
  • Volume
    25
  • Issue
    5
  • fYear
    1989
  • fDate
    9/1/1989 12:00:00 AM
  • Firstpage
    3686
  • Lastpage
    3688
  • Abstract
    A horizontal head processing approach is described in which the air bearing layer and head elements are deposited on a substrate wafer, and then a slider-body wafer is attached to the overcoated head elements by field-assisted bonding. Electrical contacts are made to the head elements through performed vias in the slider-body wafer. The original substrate wafer is etched away to expose the air bearing surface, which then has slider features such as leading edge steps, negative pressure pockets, and rail definitions wet-etched into it. Terminal metallurgy and solder balls are deposited on top of the resulting wafer, which is then diced into individual sliders. Self-loading, mechanical-only sliders (not containing head elements) were made by this approach and successfully flow and start-stop tested. A method for making submicron write-read gaps by direct write electron-beam and reactive ion etching to form a photoresist fence about which Permalloy pole pieces are plated was demonstrated, and a similar method for making gaps filled with hard carbon fences is proposed. A novel magnetoresistive read structure is described
  • Keywords
    etching; magnetic heads; magnetic thin film devices; magnetoresistance; Permalloy pole pieces; RIE; air bearing layer; direct write electron-beam; electrical contacts; field-assisted bonding; hard C fences; horizontal head processing; leading edge steps; magnetic heads; magnetoresistive read structure; negative pressure pockets; overcoated head elements; performed vias; photoresist fence; rail definitions; reactive ion etching; self-loading sliders; slider-body wafer; solder balls; submicron write-read gaps; substrate wafer; thin film head-slider devices; wet etching; Automatic testing; Contacts; Lead; Magnetic heads; Rails; Resists; Substrates; Thin film devices; Wafer bonding; Wet etching;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.42401
  • Filename
    42401