Transport properties of YBaCuO step edge Josephson junctions

Author

Vildic, M. ; Friedl, G. ; Uhl, D. ; Dallmans, G. ; Kohler, H. ; Meyer, H. ; Bommel, F. ; Saemann-Ischenko, G.

Author_Institution

Siemens AG, Erlangen, Germany

Volume

3

Issue

1

fYear

1993

fDate

3/1/1993 12:00:00 AM

Firstpage

2357

Lastpage

2360

Abstract

Step edge Josephson junctions have been prepared on

Keywords

Josephson effect; SQUIDs; barium compounds; critical current density (superconductivity); flux flow; high-frequency effects; high-temperature superconductors; superconducting thin films; yttrium compounds; 3 to 10 micron; 35 GHz; 4 K; 77 K; SQUID; Shapiro steps; SrTiO/sub 3/ substrate; YBaCu/sub 3/O/sub 7- delta / step edge junction; applied magnetic field; bicrystalline substrates; critical current density; current-voltage characteristics; flux flow; grain boundary junctions; induced microwave current step measurements; interference pattern; microshorts; microwave irradiation; step edge Josephson junctions; superconductor-normal conductor-superconductor; transport properties; Critical current; Current measurement; Current-voltage characteristics; Density measurement; Fluid flow measurement; Josephson junctions; Magnetic field measurement; Microwave measurements; Superconducting microwave devices; Yttrium barium copper oxide;

fLanguage

English

Journal_Title

Applied Superconductivity, IEEE Transactions on

Publisher

ieee

ISSN

1051-8223

Type

jour

DOI

10.1109/77.233428

Filename

233428