Surface resistance of epitaxial and polycrystalline NbCN films in submillimeter wave region

Author

Kohjiro, S. ; Kiryu, S. ; Shoji, A.

Author_Institution

Electrotech. Lab., Ibaraki, Japan

Volume

3

Issue

1

fYear

1993

fDate

3/1/1993 12:00:00 AM

Firstpage

1765

Lastpage

1767

Abstract

Surface resistances, R/sub s/´s, of epitaxial and polycrystalline NbCN films in submillimeter-wave region were evaluated from measurements of Fiske-resonant modes in Josephson tunnel junctions. It is found that epitaxial NbCN films have about one order of magnitude smaller R/sub s/ values than those for polycrystalline NbCN films. It is also found that the frequency dependence of R/sub s/ of epitaxial and polycrystalline NbCN films can be explained by the two-fluid model.<>

Keywords

Josephson effect; niobium compounds; penetration depth (superconductivity); sputtered coatings; superconducting epitaxial layers; superconducting junction devices; superconducting thin films; surface conductivity; type II superconductors; Fiske-resonant modes; Josephson tunnel junctions; NbCN-MgO-NbCN epitaxial junction; frequency dependence; penetration depth; polycrystalline film; sputter deposition; submillimeter-wave region; surface resistance; two-fluid model; Electrical resistance measurement; Electrodes; Frequency dependence; Magnetic films; Magnetic resonance; Submillimeter wave measurements; Substrates; Surface resistance; Surface waves; Voltage;

fLanguage

English

Journal_Title

Applied Superconductivity, IEEE Transactions on

Publisher

ieee

ISSN

1051-8223

Type

jour

DOI

10.1109/77.233592

Filename

233592