RF power dependence of YBCO thick films

Author

Button, T.W. ; Smith, P.A. ; Wu, Z. ; Alford, N.McN. ; Davis, L.E. ; Penn, S.J.

Author_Institution

ICI plc, Runcorn, UK

Volume

3

Issue

1

fYear

1993

fDate

3/1/1993 12:00:00 AM

Firstpage

1450

Lastpage

1452

Abstract

The dependence of Q on incident power has been measured for an all-thick-film YBa/sub 2/Cu/sub 3/O/sub x/ cavity resonating in the TE/sub 011/ mode at 5.66 GHz and 77 K. The high unloaded Q of 715000 measured at low incident power levels decreases as the power level is increased, but remains over 200000 with 1.4 W incident on the cavity, which corresponds to 0.7 W dissipated in the cavity. The data have been used to calculate the RF power dependence of the R/sub s/ of thick-film YBa/sub 2/Cu/sub 3/O/sub x/, which is shown to be approximately linear for RF fields between 0 and 0.5 mT.<>

Keywords

Q-factor; barium compounds; cavity resonators; high-temperature superconductors; superconducting microwave devices; thick films; yttrium compounds; 5.66 GHz; 77 K; RF power dependence; YBa/sub 2/Cu/sub 3/O/sub x/; high temperature superconductor; high unloaded Q; incident power; resonating cavity; thick films; High temperature superconductors; Power measurement; Q measurement; Radio frequency; Superconducting materials; Superconducting microwave devices; Tellurium; Thick films; Thickness measurement; Yttrium barium copper oxide;

fLanguage

English

Journal_Title

Applied Superconductivity, IEEE Transactions on

Publisher

ieee

ISSN

1051-8223

Type

jour

DOI

10.1109/77.233623

Filename

233623