DocumentCode
943081
Title
Fast MLE for SPECT using an intermediate polar representation and a stopping criterion
Author
Hebert, Tom ; Leahy, Richard ; Singh, Manbir
Author_Institution
Univ. of Southern California, Los Angeles, CA, USA
Volume
35
Issue
1
fYear
1988
fDate
2/1/1988 12:00:00 AM
Firstpage
615
Lastpage
619
Abstract
The maximum-likelihood estimation (MLE) approach to SPECT (single-photon-emission computed tomography) has received considerable interest since the application of the expectation maximum (EM) algorithm to emission tomography. In addition to the appealing asymptotic properties of MLE solutions, the EM algorithm guarantees convergence to a positive solution. In practice, several drawbacks to an MLE approach are encountered: the computational demands are quite large, especially in comparison to noniterative techniques; reconstructions tend to take on an increasingly, nonsmooth quality as the MLE solution is approached, so the algorithm is usually terminated long before convergence. The authors address these problems in two ways: they perform the actual source estimation on a rectangular grid but use a polar pixel representation of the source during forward/back projection operations to reduce the computational requirements; they use a chi-squared test to statistically determine a suitable cutoff point for the iterative process.
Keywords
computerised tomography; radioisotope scanning and imaging; SPECT; actual source estimation; chi-squared test; computational demands; cutoff point; emission tomography; expectation maximum; forward/back projection operations; intermediate polar representation; maximum-likelihood estimation; noniterative techniques; nonsmooth quality; polar pixel representation; reconstructions; rectangular grid; single-photon-emission computed tomography; stopping criterion; Grid computing; Image processing; Image reconstruction; Iterative algorithms; Iterative methods; Maximum likelihood estimation; Pixel; Positron emission tomography; Radiology; Signal processing;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/23.12798
Filename
12798
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