• DocumentCode
    943220
  • Title

    MODELLA-a new physics-based compact model for lateral p-n-p transistors

  • Author

    O´Hara, Francis G. ; Van den Biesen, Jan J H ; de Graaff, H.C. ; Kloosterman, W.J. ; Foley, J. Barton

  • Author_Institution
    Philips Res. Labs., Eindhoven, Netherlands
  • Volume
    39
  • Issue
    11
  • fYear
    1992
  • fDate
    11/1/1992 12:00:00 AM
  • Firstpage
    2553
  • Lastpage
    2561
  • Abstract
    A lateral p-n-p compact model, suitable for computer-aided circuit design purposes, is introduced. In this formulation, called MODELLA, the equivalent circuit topology, analytical equations, and model parameters are derived directly from the physics and structure of the lateral p-n-p. MODELLA incorporates current crowding effects, substrate effects, and a bias-dependent output conductance and it uses the approach to lateral p-n-p high injection modeling whereby the main currents and charges are independently related to bias-dependent minority-carrier concentrations. Model-specific aspects of the parameter determination strategy are discussed; the Ning-Tang resistance determination method, for example, is shown to be highly suitable for lateral p-n-p devices. The effectiveness of this strategy and the improved performance of this physics-based formulation become evident in comparisons between MODELLA and the standard SPICE Gummel-Poon model using measured device characteristics
  • Keywords
    bipolar transistors; circuit analysis computing; equivalent circuits; semiconductor device models; MODELLA; Ning-Tang resistance determination method; analytical equations; bias-dependent minority-carrier concentrations; bias-dependent output conductance; compact model; computer-aided circuit design; current crowding effects; equivalent circuit topology; high injection modeling; lateral p-n-p transistors; model parameters; parameter determination strategy; physics based model; substrate effects; Analytical models; Circuit analysis; Circuit synthesis; Circuit topology; Equations; Equivalent circuits; Measurement standards; Physics; Proximity effect; SPICE;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.163463
  • Filename
    163463