DocumentCode
944243
Title
Complex Dielectric Constants for Selected Near-Millimeter-Wave Materials at 245 GHz
Author
Dutta, J.M. ; Jones, C.R. ; Davé, H.
Volume
34
Issue
9
fYear
1986
fDate
9/1/1986 12:00:00 AM
Firstpage
932
Lastpage
936
Abstract
A double-beam instrument developed in this laboratory has been used to measure the complex dielectric constant of selected materials at 245 GHz. We report here the results for crystalline quartz, fused silica (Spectrosil WF and Dynasil 4000), beryllia (iso-pressed),boron nitride (hot-pressed), and a nickel ferrite (Trans-Tech 2-111). Results are compared with the data obtained by other researchers.
Keywords
Crystalline materials; Crystallization; Dielectric constant; Dielectric materials; Dielectric measurements; Ferrites; Instruments; Laboratories; Nickel; Silicon compounds;
fLanguage
English
Journal_Title
Microwave Theory and Techniques, IEEE Transactions on
Publisher
ieee
ISSN
0018-9480
Type
jour
DOI
10.1109/TMTT.1986.1133473
Filename
1133473
Link To Document