Switching probability of QFP comparators as a function of exciter slew-rate

Author

Ruby, R. ; Lee, G. ; Ko, H. ; Barfknecht, A.

Author_Institution

Hewlett-Packard Lab., Palo Alto, CA, USA

Volume

3

Issue

1

fYear

1993

fDate

3/1/1993 12:00:00 AM

Firstpage

2694

Lastpage

2697

Abstract

The current noise (inferred from switching probabilities) of quantum flux parametron (QFP) comparators has been measured as a function of exciter slew rates. It was found that at high slew rates the switching probability follows an error-function distribution quite closely. However, at low slew rates, the distribution resembles a Fermi-Dirac distribution. Good agreement with Monte-Carlo simulations for high slew-rates is seen with a current noise proportional to the Johnson noise of the damping resistors. The current noise decreases with decreasing slew rate and is in good agreement with thermal activation calculations in the limit of slow slew rates.<>

Keywords

Josephson effect; SQUIDs; comparators (circuits); electron device noise; probability; switching; DC SQUID latch; Fermi-Dirac distribution; Johnson noise; Monte-Carlo simulations; QFP comparators; current noise; damping resistors; error-function distribution; exciter slew-rate; quantum flux parametron; switching probabilities; thermal activation calculations; Circuits; Clocks; Electronics packaging; Latches; Potential energy; Probability distribution; SQUIDs; Superconducting device noise; Switches; Timing;

fLanguage

English

Journal_Title

Applied Superconductivity, IEEE Transactions on

Publisher

ieee

ISSN

1051-8223

Type

jour

DOI

10.1109/77.233982

Filename

233982