DocumentCode
949391
Title
Transport properties of proton-irradiated gallium nitride-based two-dimensional electron-gas system
Author
Gaudreau, François ; Fournier, Patrick ; Carlone, Cosmo ; Khanna, Shyam M. ; Tang, Haipeng ; Webb, Jim ; Houdayer, Alain
Author_Institution
Sherbrooke Univ., Que., Canada
Volume
49
Issue
6
fYear
2002
fDate
12/1/2002 12:00:00 AM
Firstpage
2702
Lastpage
2707
Abstract
A two-dimensional electron gas system (2DEG) is formed at the interface when a ternary alloy of aluminum gallium nitride is grown on gallium nitride. Very high carrier density can be achieved in these systems due to the strong piezoelectric and pyroelectric properties of the nitrides. The device was grown by molecular beam epitaxy and magnetron sputtering epitaxy. Through resistivity and Hall effect measurements in the temperature range 2 K to 300 K, its 2DEG conductive character, high mobility, and carrier density properties were confirmed. The effects of 2-MeV proton radiation on these properties are reported for the fluence range 1 × 1013 to 7 × 1015 cm-2. As a result of irradiation, the carrier density decreases by a factor of two whereas the mobility degrades by about a factor of a thousand. A fluence between 3 × 1014 cm-2 and 3 × 1015 cm-2 is necessary to drive a conductor to insulator transition for this 2-D gas and the change of phase is attributed mainly to changes in the mobility. This change of phase is determined by quantum conditions and could be used to establish an absolute standard for radiation damage.
Keywords
Hall effect; III-V semiconductors; aluminium compounds; carrier density; carrier mobility; gallium compounds; molecular beam epitaxial growth; proton effects; semiconductor heterojunctions; sputter deposition; two-dimensional electron gas; wide band gap semiconductors; 2 MeV; 2 to 300 K; 2D electron gas system; 2DEG conductive character; AlGaN-GaN; AlGaN/GaN structure; Hall effect measurements; MBE; carrier density; magnetron sputtering epitaxy; mobility; molecular beam epitaxy; piezoelectric properties; proton-irradiated GaN-based 2DEG system; pyroelectric properties; quantum conditions; radiation damage; resistivity measurements; transport properties; two-dimensional electron gas system; Aluminum alloys; Aluminum gallium nitride; Charge carrier density; Electrons; Gallium alloys; Gallium nitride; III-V semiconductor materials; Molecular beam epitaxial growth; Pyroelectricity; Temperature measurement;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.2002.805358
Filename
1134207
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