• DocumentCode
    950875
  • Title

    Testing of an inductive current-limiting device based on high-T/sub c/ superconductors

  • Author

    Meerovich, V. ; Sokolovksy, V.L. ; Slonim, M. ; Shter, G.E. ; Grader, G.S.

  • Author_Institution
    Ben-Gurion Univ. of the Negev, Beer-Sheva, Israel
  • Volume
    3
  • Issue
    3
  • fYear
    1993
  • Firstpage
    3033
  • Lastpage
    3036
  • Abstract
    An inductive current-limiting device (CLD) based on transition of a superconductor to the normal state is investigated. The device has low impedance under normal conditions of the circuit to be protected, and a high impedance developed rapidly in a self-switching mode under fault conditions. A model of the device consisting of a copper coil and a high-temperature superconducting ring, coupled magnetically, was tested. It is shown that the transition of the ring to the normal state and its return to the superconducting state take place in a relatively smooth manner, and do not lead to overvoltages across circuit elements. On the other hand, the rate of impedance rise is sufficient to limit both the steady-state and transient components of fault current. The influence of thermal processes in the ring on transient responses in the circuit with the CLD is discussed. Some considerations for a full a size design are also presented.<>
  • Keywords
    current limiting reactors; electron device testing; fault currents; high-temperature superconductors; superconducting devices; 77 K; CLD; Cu coil; YBaCuO; device testing; electrical reactors; fault current; high-temperature superconducting ring; impedance; inductive current-limiting device; overvoltages; self-switching mode; superconductor transition; thermal processes; transient responses; Circuit faults; Circuit testing; Copper; Coupling circuits; Cross layer design; High temperature superconductors; Impedance; Magnetic devices; Protection; Superconducting coils;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/77.234837
  • Filename
    234837