• DocumentCode
    951238
  • Title

    Electrical Conduction Mechanisms of Barium-Titanate-Based Thick-Film Capacitors

  • Author

    Yoo, In K. ; Burton, Larry C. ; Stephenson, F. William

  • Author_Institution
    Virginia Polytechnic Institute and State University,Blacksburg
  • Volume
    10
  • Issue
    2
  • fYear
    1987
  • fDate
    6/1/1987 12:00:00 AM
  • Firstpage
    274
  • Lastpage
    282
  • Abstract
    Electrical characteristics, including degradation, of high K ( \\cong 500) barium-titanate-based thick-film capacitors were studied. The leakage current of thick-film capacitors made from Ag/Pd thick-film conducting paste and high K dielectric has shown ohmic and super-ohmic (3/2 power voltage dependence) type behavior. Voltage independence of thermal activation energy and time dependence of leakage current were also observed. A healing effect by reversal of bias polarity and the effect of humidity on leakage current have also been studied. Models for leakage currents that increase with time are presented.
  • Keywords
    Component reliability; Thick-film capacitors; Capacitors; Degradation; Electrodes; Fabrication; Grain boundaries; High K dielectric materials; High-K gate dielectrics; Leakage current; Temperature dependence; Voltage;
  • fLanguage
    English
  • Journal_Title
    Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0148-6411
  • Type

    jour

  • DOI
    10.1109/TCHMT.1987.1134731
  • Filename
    1134731