DocumentCode
951238
Title
Electrical Conduction Mechanisms of Barium-Titanate-Based Thick-Film Capacitors
Author
Yoo, In K. ; Burton, Larry C. ; Stephenson, F. William
Author_Institution
Virginia Polytechnic Institute and State University,Blacksburg
Volume
10
Issue
2
fYear
1987
fDate
6/1/1987 12:00:00 AM
Firstpage
274
Lastpage
282
Abstract
Electrical characteristics, including degradation, of high K (
500) barium-titanate-based thick-film capacitors were studied. The leakage current of thick-film capacitors made from Ag/Pd thick-film conducting paste and high K dielectric has shown ohmic and super-ohmic (3/2 power voltage dependence) type behavior. Voltage independence of thermal activation energy and time dependence of leakage current were also observed. A healing effect by reversal of bias polarity and the effect of humidity on leakage current have also been studied. Models for leakage currents that increase with time are presented.
500) barium-titanate-based thick-film capacitors were studied. The leakage current of thick-film capacitors made from Ag/Pd thick-film conducting paste and high K dielectric has shown ohmic and super-ohmic (3/2 power voltage dependence) type behavior. Voltage independence of thermal activation energy and time dependence of leakage current were also observed. A healing effect by reversal of bias polarity and the effect of humidity on leakage current have also been studied. Models for leakage currents that increase with time are presented.Keywords
Component reliability; Thick-film capacitors; Capacitors; Degradation; Electrodes; Fabrication; Grain boundaries; High K dielectric materials; High-K gate dielectrics; Leakage current; Temperature dependence; Voltage;
fLanguage
English
Journal_Title
Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
Publisher
ieee
ISSN
0148-6411
Type
jour
DOI
10.1109/TCHMT.1987.1134731
Filename
1134731
Link To Document