DocumentCode
951630
Title
Degradation Mechanisms in Tin- and Gold-Plated Connector Contacts
Author
Yasuda, Kei-ichi ; Umemura, Shigeru ; Aoki, Takeshi
Author_Institution
NTT Applied Electronics Lab.,Japan
Volume
10
Issue
3
fYear
1987
fDate
9/1/1987 12:00:00 AM
Firstpage
456
Lastpage
462
Abstract
Degradation mechanisms in tin-plated contacts (Sn contacts) and gold-plated contacts (Au contacts) are clarified. Contact resistance and corrosion characteristics for both types of contacts are investigated and compared. Contact resistance is more stable for Sn contacts than for Au contacts in a SO2 + NO2 + C12 atmosphere. This is because relatively few corrosion products are formed on Sn contacts. Also, the surface films formed on Sn contacts shatters more easily upon plastic deformation. Corrosion experiments in atmospheres containing different combinations of SO2 , NO2 , and Cl2 demonstrate that two types of corrosion processes take place in plated contacts. One is surface corrosion which occurs when the surface finish is severely attacked by a corrosive atmosphere. The other is pore corrosion which occurs when the underplating materials are attacked to a greater extent than surface corrosion. Both processes occur in Sn contacts and the former is dominant in atmospheres containing Ci2 . On the other hand, only pore corrosion occurs in Au contacts. Furthermore, galvanic corrosion either enhances or inhibits the formation of outcroppings in the pore corrosion process, depending on the electrode potential of the surface finish and underplating materials.
Keywords
Connectors; Contacts; Corrosion; Gold materials/devices; Tin-coated contacts; Atmosphere; Connectors; Contact resistance; Corrosion; Degradation; Gold; Plastic films; Surface finishing; Surface resistance; Tin;
fLanguage
English
Journal_Title
Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
Publisher
ieee
ISSN
0148-6411
Type
jour
DOI
10.1109/TCHMT.1987.1134769
Filename
1134769
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