• DocumentCode
    951904
  • Title

    Pattern recognition properties of various feature spaces for higher order neural networks

  • Author

    Schmidt, William A C ; Davis, Jon P.

  • Author_Institution
    US Naval Air Dev. Center, Warminster, PA, USA
  • Volume
    15
  • Issue
    8
  • fYear
    1993
  • fDate
    8/1/1993 12:00:00 AM
  • Firstpage
    795
  • Lastpage
    801
  • Abstract
    The authors explore alternatives that reduce the number of network weights while maintaining geometric invariant properties for recognizing patterns in real-time processing applications. This study is limited to translation and rotation invariance. The primary interest is in examining the properties of various feature spaces for higher-order neural networks (HONNs), in correlated and uncorrelated noise, such as the effect of various types of input features, feature size and number of feature pixels, and effect of scene size. The robustness of HONN training is considered in terms of target detectability. The experimental setup consists of a 15×20 pixel scene possibly containing a 3×10 target. Each trial used 500 training scenes plus 500 testing scenes. Results indicate that HONNs yield similar geometric invariant target recognition properties to classical template matching. However, the HONNs require an order of magnitude less computer processing time compared with template matching. Results also indicate that HONNs could be considered for real-time target recognition applications
  • Keywords
    feature extraction; invariance; neural nets; feature pixels; feature spaces; geometric variance; higher order neural networks; pattern recognition; real-time target recognition; rotation invariance; template matching; translation variance; Aerospace electronics; Backpropagation; Feedforward neural networks; Layout; Neural networks; Noise robustness; Object detection; Pattern recognition; Target recognition; Testing;
  • fLanguage
    English
  • Journal_Title
    Pattern Analysis and Machine Intelligence, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0162-8828
  • Type

    jour

  • DOI
    10.1109/34.236250
  • Filename
    236250