• DocumentCode
    955057
  • Title

    Investigation of the size and spatial distribution of fillers in mold compounds after device packaging

  • Author

    Huang, Yue ; Bigio, David ; Pecht, Michael G.

  • Author_Institution
    CALCE Electron. Products & Syst. Center, Univ. of Maryland, College Park, MD
  • Volume
    29
  • Issue
    2
  • fYear
    2006
  • fDate
    6/1/2006 12:00:00 AM
  • Firstpage
    364
  • Lastpage
    370
  • Abstract
    Fillers are used in the molding compounds used to package semiconductor devices, as a means to lower costs and minimize the stress caused by thermal expansion mismatch between the silicon die and the molding compound. With ever finer feature size and increasing die dimensions, control of highly filled molding compound´s properties and processing parameters becomes more important. In this study, quantitative measures of the particle distribution of fillers in packaged devices were experimentally determined, including area fraction, size, and interparticle distance. The size and interparticle distance were statistically significant with respect to the position in the package. The difference of filler volume fraction at different positions within a package can be as large as 10%, and can cause a local coefficient of thermal expansion difference of about 4ppm/degC. A 2times3times3 ANOVA test was conducted to assess the statistical significance of these variations
  • Keywords
    moulding; semiconductor device packaging; thermal expansion; coefficient of thermal expansion; fillers spatial distribution; molding compound; semiconductor device packaging; Area measurement; Costs; Particle measurements; Semiconductor device packaging; Semiconductor devices; Silicon; Size control; Size measurement; Thermal expansion; Thermal stresses; Coefficient of thermal expansion (CTE); fillers; molding compound;
  • fLanguage
    English
  • Journal_Title
    Components and Packaging Technologies, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1521-3331
  • Type

    jour

  • DOI
    10.1109/TCAPT.2006.875874
  • Filename
    1637771