DocumentCode
955651
Title
High impedance point contact Josephson junctions
Author
Tolner, H. ; Andriesse, C.D.
Author_Institution
IEEE TMAG
Volume
11
Issue
2
fYear
1975
fDate
3/1/1975 12:00:00 AM
Firstpage
866
Lastpage
869
Abstract
We describe point contact junctions with normal state resistances of 10Ω - 10kΩ, made from electropolished Nb parts, which couple well to millimeter radiation. The response is governed by fluctuations. The principal effect of external radiation is a change in the dynamic resistance. An approximate expression is given for the differential resistance at zero current, based on a linear combination of the effect of fluctuations and of microwave radiation. Experimental data show significant deviations from the RSJ model. The results are in qualitative agreement with numerical calculations by Kalashnik et al. We argue that in our junctions zero-point fluctuations are dominant, caused by the very small capacitance of about 10-15F.
Keywords
Josephson devices; Millimeter-wave detectors; Capacitance; Contact resistance; Electrodes; Fluctuations; Impedance; Josephson junctions; Niobium; Surface resistance; Voltage; Wire;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/TMAG.1975.1058764
Filename
1058764
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