• DocumentCode
    955651
  • Title

    High impedance point contact Josephson junctions

  • Author

    Tolner, H. ; Andriesse, C.D.

  • Author_Institution
    IEEE TMAG
  • Volume
    11
  • Issue
    2
  • fYear
    1975
  • fDate
    3/1/1975 12:00:00 AM
  • Firstpage
    866
  • Lastpage
    869
  • Abstract
    We describe point contact junctions with normal state resistances of 10Ω - 10kΩ, made from electropolished Nb parts, which couple well to millimeter radiation. The response is governed by fluctuations. The principal effect of external radiation is a change in the dynamic resistance. An approximate expression is given for the differential resistance at zero current, based on a linear combination of the effect of fluctuations and of microwave radiation. Experimental data show significant deviations from the RSJ model. The results are in qualitative agreement with numerical calculations by Kalashnik et al. We argue that in our junctions zero-point fluctuations are dominant, caused by the very small capacitance of about 10-15F.
  • Keywords
    Josephson devices; Millimeter-wave detectors; Capacitance; Contact resistance; Electrodes; Fluctuations; Impedance; Josephson junctions; Niobium; Surface resistance; Voltage; Wire;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.1975.1058764
  • Filename
    1058764