DocumentCode
956929
Title
Tolerance Study of Printed-Circuit Process Steps for a Microwave Application
Author
Grace, Frank E.
Author_Institution
IBM Corp.
Volume
1
Issue
1
fYear
1965
fDate
6/1/1965 12:00:00 AM
Firstpage
16
Lastpage
27
Abstract
This study provides tolerance-distribution data for a microwave printed-circuit development utilizing "strip-line" type filters, 50-ohm transmission lines, and tuning stubs. Irradiated polyethylene is the dielectric. Data is given on tolerance distribution in the following process areas: Artwork cutting; Photographic (reduction, exposure and development, contact printing with glass and film, step-repeat camera work); Etching (including resist exposure and development). Dimensional instabilities in the irradiated polyethylene was found to be a key problem. Some of the total tolerance must be left for dimensional changes in the substrate, so the three process areas must give better than plus or minus one mil over-all tolerances. Generally speaking, on dimensionally stable material the required one-mil tolerance. (can be held throughout the three processes; where this tolerance was not held, the problem is, as noted, material instability.
Keywords
Dielectrics; Etching; Materials; Microwave; Photoetching; Polyethylene; Printed circuits; Substrates; Tolerances; Cameras; Dielectrics; Etching; Glass; Microwave filters; Polyethylene; Printing; Resists; Substrates; Transmission lines;
fLanguage
English
Journal_Title
Parts, Materials and Packaging, IEEE Transactions on
Publisher
ieee
ISSN
0018-9502
Type
jour
DOI
10.1109/TPMP.1965.1135387
Filename
1135387
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