DocumentCode
957548
Title
Temperature Coefficients of Resistance: A New Approach
Author
Marshall, Colin
Author_Institution
Newmarket Transistors Ltd.,OAU
Volume
2
Issue
2
fYear
1979
fDate
6/1/1979 12:00:00 AM
Firstpage
265
Lastpage
269
Abstract
An empirical relationship is developed for the temperature variation of thick-film resistors. From this two coefficients are derived which can be used to predict resistance and tracking variations at any temperature. The predicted results are compared to actual mea- surements.
Keywords
Thick-film circuit thermal factors; Thick-film resistors; Circuit optimization; Curve fitting; Electrical resistance measurement; Equations; Error correction; Ink; Laser stability; Mathematical model; Resistors; Temperature distribution;
fLanguage
English
Journal_Title
Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
Publisher
ieee
ISSN
0148-6411
Type
jour
DOI
10.1109/TCHMT.1979.1135452
Filename
1135452
Link To Document