DocumentCode
957889
Title
2006 Best Paper Award
Author
Boning, Duane S.
Volume
20
Issue
4
fYear
2007
Firstpage
341
Lastpage
342
Abstract
The IEEE Transactions on Semiconductor Manufacturing awarded the 2006 Best Paper Award to T. Pfingsten and D.J.L. Herrmann for their paper, "Model-based design analysis and yield optmization."
Keywords
Awards;
fLanguage
English
Journal_Title
Semiconductor Manufacturing, IEEE Transactions on
Publisher
ieee
ISSN
0894-6507
Type
jour
DOI
10.1109/TSM.2007.910546
Filename
4369325
Link To Document