• DocumentCode
    957981
  • Title

    Reliable Multiwire Circuits with Small Gauge Wires

  • Author

    Sugita, Etsuji ; Ibaragi, Osamu

  • Author_Institution
    Electronic Equipment Development Division,NTT, Japan
  • Volume
    2
  • Issue
    4
  • fYear
    1979
  • fDate
    12/1/1979 12:00:00 AM
  • Firstpage
    532
  • Lastpage
    536
  • Abstract
    Reliable Multiwire circuits have been developed. The objective of this development was to reduce design and assembly cost of backwiring boards in an electronic switching system. To realize high holeto-wire connection reliability, various factors were investigated and the following results have been obtained. 1) The use of Pyre-ML as a wire insulating material is the most effective for obtaining high connection reliability because of its solubility in alkaline type plating solution. 2) In manufacturing processes, cleaning of resin smear is the most important process. 3) Pads around plated through-holes are effective for reduction in thermal expansion around plated through-holes and failure rate is reduced to 2 percent with pads. By using these technologies, Multiwire circuits with a wire thicker than 0.09 mm have obtained equal or higher connection reliability, compared with multilayer printed circuits.
  • Keywords
    Printed circuits; System reliability; Telephone switching; Assembly systems; Cable insulation; Circuits; Cleaning; Costs; Electronic switching systems; Manufacturing processes; Materials reliability; Resins; Wire;
  • fLanguage
    English
  • Journal_Title
    Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0148-6411
  • Type

    jour

  • DOI
    10.1109/TCHMT.1979.1135495
  • Filename
    1135495