DocumentCode
957981
Title
Reliable Multiwire Circuits with Small Gauge Wires
Author
Sugita, Etsuji ; Ibaragi, Osamu
Author_Institution
Electronic Equipment Development Division,NTT, Japan
Volume
2
Issue
4
fYear
1979
fDate
12/1/1979 12:00:00 AM
Firstpage
532
Lastpage
536
Abstract
Reliable Multiwire circuits have been developed. The objective of this development was to reduce design and assembly cost of backwiring boards in an electronic switching system. To realize high holeto-wire connection reliability, various factors were investigated and the following results have been obtained. 1) The use of Pyre-ML as a wire insulating material is the most effective for obtaining high connection reliability because of its solubility in alkaline type plating solution. 2) In manufacturing processes, cleaning of resin smear is the most important process. 3) Pads around plated through-holes are effective for reduction in thermal expansion around plated through-holes and failure rate is reduced to 2 percent with pads. By using these technologies, Multiwire circuits with a wire thicker than 0.09 mm have obtained equal or higher connection reliability, compared with multilayer printed circuits.
Keywords
Printed circuits; System reliability; Telephone switching; Assembly systems; Cable insulation; Circuits; Cleaning; Costs; Electronic switching systems; Manufacturing processes; Materials reliability; Resins; Wire;
fLanguage
English
Journal_Title
Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
Publisher
ieee
ISSN
0148-6411
Type
jour
DOI
10.1109/TCHMT.1979.1135495
Filename
1135495
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