• DocumentCode
    959505
  • Title

    Physical Interpretation of the Tantalum Chip Capacitor Life-Test Results

  • Author

    Loh, Eugene

  • Author_Institution
    Hughes Aircraft Company,CA
  • Volume
    3
  • Issue
    4
  • fYear
    1980
  • fDate
    12/1/1980 12:00:00 AM
  • Firstpage
    647
  • Lastpage
    654
  • Abstract
    Tantalum chip capacitors that survived accelerated life tests at 85°C and 2.5 times the rated voltage exhibited different dc electrical relationships prior to the accelerated life tests than did tantalum chip capacitors that failed the tests. This useful dc characterization may be interpreted in terms of the presence of an effcient blocking barrier between the MnO2cathode and the Ta205dielectric film in good capacitors and the absence of the barrier in defective capacitors.
  • Keywords
    Capacitors; Life testing; Tantalum devices; Capacitors; Cathodes; Dielectric films; Dielectric measurements; Electrodes; Life estimation; Life testing; Low voltage; Semiconductor device measurement; Semiconductor films;
  • fLanguage
    English
  • Journal_Title
    Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0148-6411
  • Type

    jour

  • DOI
    10.1109/TCHMT.1980.1135658
  • Filename
    1135658
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=959505