• DocumentCode
    961278
  • Title

    Surface Treatments and Bondability of Copper Thick Film Circuits

  • Author

    Liu, T.S. ; Pitkanen, David E. ; McIver, Chandler H.

  • Author_Institution
    Honeywell Inc., MN and Norththrop Corp., CA
  • Volume
    4
  • Issue
    4
  • fYear
    1981
  • fDate
    12/1/1981 12:00:00 AM
  • Firstpage
    417
  • Lastpage
    424
  • Abstract
    Crucial issues in using copper thick film microcircuits, namely, surface treatment and bondability, are addressed. A multilayer multichip ceramic substrate package with copper thick film conductors was used for these experiments. Surface treatments for bondability specific to different types of bonding sites are discussed. Using a flip tape automated bonding (TAB) technology, the resultant bond interfaces were analyzed in the as-bonded as well as thermally aged conditions. Results indicate a metallurgically stable materials system which should exhibit long-term reliability. Specific recommendations on copper surface treatments and general guidelines on materials selection are made on the production of reliable copper thick film interconnections.
  • Keywords
    Copper devices; Thick-film circuit bonding; Bonding; Ceramics; Conducting materials; Copper; Materials reliability; Nonhomogeneous media; Substrates; Surface treatment; Thick film circuits; Thick films;
  • fLanguage
    English
  • Journal_Title
    Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0148-6411
  • Type

    jour

  • DOI
    10.1109/TCHMT.1981.1135842
  • Filename
    1135842