DocumentCode
961278
Title
Surface Treatments and Bondability of Copper Thick Film Circuits
Author
Liu, T.S. ; Pitkanen, David E. ; McIver, Chandler H.
Author_Institution
Honeywell Inc., MN and Norththrop Corp., CA
Volume
4
Issue
4
fYear
1981
fDate
12/1/1981 12:00:00 AM
Firstpage
417
Lastpage
424
Abstract
Crucial issues in using copper thick film microcircuits, namely, surface treatment and bondability, are addressed. A multilayer multichip ceramic substrate package with copper thick film conductors was used for these experiments. Surface treatments for bondability specific to different types of bonding sites are discussed. Using a flip tape automated bonding (TAB) technology, the resultant bond interfaces were analyzed in the as-bonded as well as thermally aged conditions. Results indicate a metallurgically stable materials system which should exhibit long-term reliability. Specific recommendations on copper surface treatments and general guidelines on materials selection are made on the production of reliable copper thick film interconnections.
Keywords
Copper devices; Thick-film circuit bonding; Bonding; Ceramics; Conducting materials; Copper; Materials reliability; Nonhomogeneous media; Substrates; Surface treatment; Thick film circuits; Thick films;
fLanguage
English
Journal_Title
Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
Publisher
ieee
ISSN
0148-6411
Type
jour
DOI
10.1109/TCHMT.1981.1135842
Filename
1135842
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