• DocumentCode
    962591
  • Title

    Measurements on CMOS circuit internal loads using capacitive pads

  • Author

    Rojder, P. ; Svensson, Christer

  • Author_Institution
    LSI Design Center, Linkoping Univ., Sweden
  • Volume
    25
  • Issue
    11
  • fYear
    1989
  • fDate
    5/25/1989 12:00:00 AM
  • Firstpage
    754
  • Lastpage
    756
  • Abstract
    A new method for measurements on internal nodes in CMOS circuits without severe loading is proposed. The method is based on the use of capacitive pads and can be used up to 200 MHz. Simulations and some practical measurements are demonstrated.
  • Keywords
    CMOS integrated circuits; integrated circuit testing; 200 MHz; CMOS circuit; IC test method; capacitive pads; internal loads; internal nodes; measurements;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19890510
  • Filename
    24122
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=962591