• DocumentCode
    963151
  • Title

    The Y-bar switch--A single-level-masking switch

  • Author

    Cohen, M.S. ; Beall, G.W. ; Hsieh, W.J. ; Chang, H.

  • Author_Institution
    IBM T.J. Watson Research Center, Yorktown Hgts, NY
  • Volume
    13
  • Issue
    5
  • fYear
    1977
  • fDate
    9/1/1977 12:00:00 AM
  • Firstpage
    1264
  • Lastpage
    1266
  • Abstract
    The operating margins of the Y-bar switch are analyzed for both the double-level-masking (DLM) and single-level-masking (SLM) implementations. It is found that while both implementations show similar performance, two additional failure modes not seen in the DLM are found in the SLM version: 1. Bubble collapse at the base of the Y bar. 2. Bubble stripout along the conductor. Both of these failure modes are associated with magnetization reversal in the NiFe of the conductor. These failure mechanisms can be mitigated by good geometrical design and by application of an appropriate pulse sequence during operation.
  • Keywords
    Magnetic bubble memories; Magnetic bubble switching; Conductors; Design for manufacture; Failure analysis; Garnets; Gold; Magnetization reversal; Optical devices; Optical switches; Strips; X-ray lithography;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.1977.1059525
  • Filename
    1059525