Measurement of the complex permittivity of low-loss planar microwave substrates using aperture-coupled microstrip resonators

Author

Saed, Mohammad A.

Author_Institution

Dept. of Electr. Eng., State Univ. of New York, New Paltz, NY, USA

Volume

41

Issue

8

fYear

1993

fDate

8/1/1993 12:00:00 AM

Firstpage

1343

Lastpage

1348

Abstract

This paper describes a technique for the determination of the complex permittivity of low-loss dielectric substrates at microwave frequencies. The technique utilizes an aperture-coupled microstrip resonator fed using a microstrip line in a two layer configuration. The ends of the resonator are shorted in order to avoid radiation. The technique can also be used for the measurement of the complex permittivity of other electronic materials such as thin and thick film materials at microwave frequencies. Nonresonant modes and conductor losses are taken into account in the analysis to improve the accuracy of the results. Analysis procedure as well as experimental results are presented

Keywords

microstrip components; microwave integrated circuits; microwave measurement; permittivity measurement; resonators; substrates; analysis procedure; aperture-coupled microstrip resonators; complex permittivity; conductor losses; dielectric substrates; electronic materials; low-loss planar microwave substrates; microstrip line; microstrip resonators; microwave frequencies; nonresonant modes; thick film materials; thin film materials; two layer configuration; Conducting materials; Dielectric materials; Dielectric measurements; Dielectric substrates; Frequency measurement; Microstrip resonators; Microwave frequencies; Microwave measurements; Permittivity measurement; Thickness measurement;

fLanguage

English

Journal_Title

Microwave Theory and Techniques, IEEE Transactions on

Publisher

ieee

ISSN

0018-9480

Type

jour

DOI

10.1109/22.241673

Filename

241673