• DocumentCode
    965238
  • Title

    Reducing In-Circuit Testing Costs with Self-Correcting Program Generations

  • Author

    Borrelli, Ronald N.

  • Author_Institution
    Zehntel, Inc.Concord,CA
  • Volume
    6
  • Issue
    3
  • fYear
    1977
  • fDate
    9/1/1977 12:00:00 AM
  • Firstpage
    61
  • Lastpage
    63
  • Keywords
    Automatic testing; Printed circuits; Production testing; Assembly; Automatic testing; Circuit testing; Costs; Debugging; Inspection; Printed circuits; Programming profession; Software testing; System testing;
  • fLanguage
    English
  • Journal_Title
    Manufacturing Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0046-838X
  • Type

    jour

  • DOI
    10.1109/TMFT.1977.1136235
  • Filename
    1136235
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=965238