DocumentCode
965643
Title
Effect of leakage current on the power output of s band TRAPATT oscillators
Author
Borrego, J.M. ; Gutmann, R.J. ; Geipel, H.J.
Author_Institution
Rensselaer Polytechnic Institute, Electrophysics & Electronic Engineering Division, Troy, USA
Volume
10
Issue
14
fYear
1974
Firstpage
277
Lastpage
278
Abstract
The effect of externally enhanced leakage current on S band TRAPATT diodes is reported. Without enhanced leakage, the TRAPATT has an effective leakage current density of the order of 0·4 A/cm2. Calculations indicate that the leakage current due to carrier storage provides the electron density for initiating the avalanche process.
Keywords
avalanche diodes; leakage currents; microwave oscillators; solid-state microwave circuits; transit time devices; S-band; TRAPATT devices; avalanche diodes; leakage current effect; leakage currents; solid state microwave oscillators; transit time devices;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19740220
Filename
4245183
Link To Document