DocumentCode
965868
Title
Scattering matrix simulation of electron transport in model bipolar devices
Author
Das, Amitava ; Lundstrom, Mark S.
Author_Institution
Sch. of Electr. Eng., Purdue Univ., West Lafayette, IN, USA
Volume
39
Issue
5
fYear
1992
fDate
5/1/1992 12:00:00 AM
Firstpage
1157
Lastpage
1163
Abstract
The scattering matrix approach is a new technique for solving the Boltzmann transport equation in semiconductor devices. The authors extend the technique so that it can treat the very low electric fields and energy barriers often found in devices. Applications of the new technique to advanced device simulation are demonstrated by simulating a model silicon p-n junction and bipolar transistor. The results demonstrate that the scattering matrix approach can resolve the position-dependent distribution function in advanced devices
Keywords
S-matrix theory; bipolar transistors; p-n homojunctions; semiconductor device models; Boltzmann transport equation; Si p-n junction; advanced devices; device simulation; electron transport; energy barriers; low electric fields; model bipolar devices; position-dependent distribution function; scattering matrix approach; semiconductor devices; Bipolar transistors; Boltzmann equation; Distribution functions; Electrons; Energy barrier; Energy resolution; P-n junctions; Scattering; Semiconductor devices; Silicon;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/16.129097
Filename
129097
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