• DocumentCode
    965868
  • Title

    Scattering matrix simulation of electron transport in model bipolar devices

  • Author

    Das, Amitava ; Lundstrom, Mark S.

  • Author_Institution
    Sch. of Electr. Eng., Purdue Univ., West Lafayette, IN, USA
  • Volume
    39
  • Issue
    5
  • fYear
    1992
  • fDate
    5/1/1992 12:00:00 AM
  • Firstpage
    1157
  • Lastpage
    1163
  • Abstract
    The scattering matrix approach is a new technique for solving the Boltzmann transport equation in semiconductor devices. The authors extend the technique so that it can treat the very low electric fields and energy barriers often found in devices. Applications of the new technique to advanced device simulation are demonstrated by simulating a model silicon p-n junction and bipolar transistor. The results demonstrate that the scattering matrix approach can resolve the position-dependent distribution function in advanced devices
  • Keywords
    S-matrix theory; bipolar transistors; p-n homojunctions; semiconductor device models; Boltzmann transport equation; Si p-n junction; advanced devices; device simulation; electron transport; energy barriers; low electric fields; model bipolar devices; position-dependent distribution function; scattering matrix approach; semiconductor devices; Bipolar transistors; Boltzmann equation; Distribution functions; Electrons; Energy barrier; Energy resolution; P-n junctions; Scattering; Semiconductor devices; Silicon;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.129097
  • Filename
    129097